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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 25 August 2013)] Nanoepitaxy: Materials and Devices V - Electronic effects of defects in one-dimensional channels
Fuller, Elliot J., Pan, Deng, Corso, Brad L., Gul, O. Tolga, Collins, Philip G., Kobayashi, Nobuhiko P., Talin, A. Alec, Davydov, Albert V., Islam, M. SaifVolume:
8820
Year:
2013
Language:
english
DOI:
10.1117/12.2025587
File:
PDF, 713 KB
english, 2013