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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Cyber Sensing 2013 - Digital microarray analysis for digital artifact genomics
Jaenisch, Holger, Handley, James, Williams, Deborah, Ternovskiy, Igor V., Chin, PeterVolume:
8757
Year:
2013
Language:
english
DOI:
10.1117/12.2030990
File:
PDF, 2.26 MB
english, 2013