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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 14 April 2014)] Optical Modelling and Design III - Study of the total light flux measurement of wafer-level LED in a multichannel LED measuring system with non-imaging concentrator array
Wyrowski, Frank, Sheridan, John T., Tervo, Jani, Meuret, Youri, Chen, Yi-Jiun, Peng, Yao-Chi, Chen, Yu-Tang, Cheng, Chen-Chin, Lin, Hoang YanVolume:
9131
Year:
2014
Language:
english
DOI:
10.1117/12.2052089
File:
PDF, 663 KB
english, 2014