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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - Development of achromatic full-field hard x-ray microscopy and its application to x-ray absorption near edge structure spectromicroscopy
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Matsuyama, S., Emi, Y., Kino, H., Kohmura, Y., Yabashi, M., Ishikawa, T., Yamauchi, K.Volume:
9207
Year:
2014
Language:
english
DOI:
10.1117/12.2060783
File:
PDF, 6.78 MB
english, 2014