SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The art of specifying surface quality
Han, Sen, Yoshizawa, Toru, Zhang, Song, Stover, John, Han, SenVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071006
File:
PDF, 279 KB
english, 2014