SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - Las Vegas, Nevada, United States (Sunday 20 March 2016)] Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2016 - Non-destructive evaluation of adhesive layer using a planar array capacitive imaging technology
Yu, Tzuyang, Gyekenyesi, Andrew L., Shull, Peter J., Wu, H. Felix, Zhang, Yuyan, Zhao, Limei, Wen, Yintang, Sun, DongtaoVolume:
9804
Year:
2016
Language:
english
DOI:
10.1117/12.2225620
File:
PDF, 579 KB
english, 2016