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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Methods and apparatus for optical diagnostics with high-accuracy polarimetry
Shopa, Yaroslav I., Svechnikov, Sergey V., Valakh, Mikhail Y., Kravchuk, Modest O., Vlokh, Orest G.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226131
File:
PDF, 308 KB
english, 1995