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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Photoluminescence controls as-grown porous silicon-air interaction
Dikiy, S. P., Svechnikov, Sergey V., Valakh, Mikhail Y., Sardarly, A. D., Baranetz, S. V., Fedorenko, Leonid L., Svechnikov, Sergey V., Kaganovich, E. B.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226190
File:
PDF, 104 KB
english, 1995