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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Methods of testing light-emitting elements and devices for middle- and far-IR spectral regions based on negative luminescence phenomena
Bolgov, Sergej S., Svechnikov, Sergey V., Valakh, Mikhail Y., Botte, Victor A., Konopaltseva, Lyudmila I., Pipa, Victor I., Savchenko, Anna P.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226200
File:
PDF, 345 KB
english, 1995