SPIE Proceedings [SPIE BiOS Europe '95 - Barcelona, Spain (Tuesday 12 September 1995)] Optical Biopsies - Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters
Wang, Lihong V., Lin, Shao-Pow, Jacques, Steven L., Tittel, Frank K., Harder, Jennifer, Jancarik, John, Mammini, Beth M., Small IV, Ward, Da Silva, Luiz B., Cubeddu, Rinaldo, Mordon, Serge R., SvanberVolume:
2627
Year:
1995
Language:
english
DOI:
10.1117/12.228887
File:
PDF, 276 KB
english, 1995