![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Three-Dimensional Microscopy: Image Acquisition and Processing III - New technique for real-time testing and alignment of high-NA lenses
Mueller, Michiel, Brakenhoff, G. J., Cogswell, Carol J., Kino, Gordon S., Wilson, TonyVolume:
2655
Year:
1996
Language:
english
DOI:
10.1117/12.237493
File:
PDF, 311 KB
english, 1996