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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO, United States (Sunday 4 August 1996)] Laser Interferometry VIII: Techniques and Analysis - Leaky waveguide laser diodes for advanced manufacturing and metrology
Zhong, Jingchang, Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Li, Ronghui, Zhao, Yingjie, Takeda, Mitsuo, Qu, YiVolume:
2860
Year:
1996
Language:
english
DOI:
10.1117/12.276322
File:
PDF, 378 KB
english, 1996