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SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Moire interferometry/termovision method for electronic package testing
Salbut, Leszek A., Kujawinska, Malgorzata, Gorecki, ChristopheVolume:
3098
Year:
1997
Language:
english
DOI:
10.1117/12.281157
File:
PDF, 315 KB
english, 1997