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SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Photodetectors: Materials and Devices III - Ballistic electron emission microscopy (BEEM) of novel semiconductor heterostructures and quantum dots
Narayanamurti, Venkatesh, Brown, Gail J.Volume:
3287
Year:
1998
Language:
english
DOI:
10.1117/12.304476
File:
PDF, 2.28 MB
english, 1998