SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Targets and Backgrounds: Characterization and Representation IV - Determination of material parameters and influence of measurement errors on the reflection and backscatter properties of realistic material arrangements
Preissner, Juergen, Stein, Volker, Watkins, Wendell R., Clement, DieterVolume:
3375
Year:
1998
Language:
english
DOI:
10.1117/12.327157
File:
PDF, 1.64 MB
english, 1998