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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA, USA (Sunday 19 July 1998)] Infrared Technology and Applications XXIV - Ultrathin Ir 3 Si 4 silicide films for infrared detection
Mahlein, Karl-Martin, Andresen, Bjorn F., Strojnik, Marija, Woerle, Dieter, Hierl, Thomas, Schulz, Max J.Volume:
3436
Year:
1998
Language:
english
DOI:
10.1117/12.328009
File:
PDF, 319 KB
english, 1998