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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Sensors and Controls for Intelligent Machining, Agile Manufacturing, and Mechatronics - Application of adaptive texture filters to the automated visual inspection of antibiotic susceptibility tests
Zhang, David Z., Snowden, Simon, Wang, Jia-Chang, Kind, David, Muir, Patrick F., Orban, Peter E.Volume:
3518
Year:
1998
Language:
english
DOI:
10.1117/12.332805
File:
PDF, 1.60 MB
english, 1998