SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Near-Field Optics: Physics, Devices, and Information Processing - 3D-FDTD and experimental analysis of a resonant microcavity probe for high-resolution SNOM
Oshikane, Yasushi, Nakagawa, Hirofumi, Kataoka, Toshihiko, Endo, Katsuyoshi, Inoue, Haruyuki, Hirai, Takayuki, Jutamulia, Suganda, Ohtsu, Motoichi, Asakura, ToshimitsuVolume:
3791
Year:
1999
Language:
english
DOI:
10.1117/12.363862
File:
PDF, 3.85 MB
english, 1999