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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Access round-view datacloud for three-dimensional vision inspection applications
Zhou, Huicheng, Chen, Jihong, Yang, Daoshan, Zhou, Ji, Buckley, Shawn, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380063
File:
PDF, 390 KB
english, 2000