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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Real-time FPGA architectures for computer vision
Arias-Estrada, Miguel, Torres-Huitzil, Cesar, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380096
File:
PDF, 754 KB
english, 2000