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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Rare-Earth-Doped Materials and Devices IV - Evaluation of cross sections of rare-earth ions in glass
Li, Maohe, Jiang, Shibin, Lin, Yan, Hu, HefangVolume:
3942
Year:
2000
Language:
english
DOI:
10.1117/12.382866
File:
PDF, 260 KB
english, 2000