SPIE Proceedings [SPIE Symposium on Integrated...

  • Main
  • SPIE Proceedings [SPIE Symposium on...

SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Rare-Earth-Doped Materials and Devices IV - Evaluation of cross sections of rare-earth ions in glass

Li, Maohe, Jiang, Shibin, Lin, Yan, Hu, Hefang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3942
Year:
2000
Language:
english
DOI:
10.1117/12.382866
File:
PDF, 260 KB
english, 2000
Conversion to is in progress
Conversion to is failed