SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara,...

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SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Advances in Resist Technology and Processing XVII - Reaction mechanisms in silicon-based resist materials: polysilanes for deep-UV, EUV, and x-ray lithography

Seki, Shu, Houlihan, Francis M., Sakurai, Yusuke, Maeda, Kazuki, Kunimi, Yoshihisa, Nagahara, Seiji, Tagawa, Seiichi
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Volume:
3999
Year:
2000
Language:
english
DOI:
10.1117/12.388326
File:
PDF, 316 KB
english, 2000
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