SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Advanced Photonic Sensors: Technology and Applications - Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Hu, Guijun, Shi, Jiawei, Zhang, Sumei, Lu, Yu, Qi, LiYun, Li, Hongyan, Zhang, Fenggang, Tang, Jinfa, Xu, Chao-Nan, Li, Haizhang
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Volume:
4220
Year:
2000
Language:
english
DOI:
10.1117/12.401718
File:
PDF, 113 KB
english, 2000
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