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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Instruments for Optics and Optoelectronic Inspection and Control - La-implanted Si-based emitting film materials
Yuan, Meiling, Wei, Guang Hui, Liu, Sheng, Wang, Qingnian, Zeng, Yuxin, Wang, Shuifeng, Xu, Fei, Cheng, GuoanVolume:
4223
Year:
2000
Language:
english
DOI:
10.1117/12.401793
File:
PDF, 199 KB
english, 2000