SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - Measurement of a large 3D curved surface

Wang, Jinjiang, Song, FeiJun, Chen, Frank, Chang, Jun, Zhu, Yongkai, Hung, Michael Y.Y., Shang, H.M., Yang, Zhiwen
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Volume:
4221
Year:
2000
Language:
english
DOI:
10.1117/12.402618
File:
PDF, 87 KB
english, 2000
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