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SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Refractive index measurement for planar photonic crystal using a microscopy-spectrometry method
Ouyang, Mike X., Chu, Junhao, Liu, Pulin, Onyiriuka, Emmanuel C., Kinney, L. D., Chang, YongVolume:
4086
Year:
2000
Language:
english
DOI:
10.1117/12.408415
File:
PDF, 1.47 MB
english, 2000