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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Coordinate reference system of nonstationary signals
Timchenko, Leonid I., Kutaev, Yuri F., Zhukov, Konstantin M., Gertsiy, Alexander A., Shweiki, Nafez O., Grinchishin, Ruslan M., Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417191
File:
PDF, 282 KB
english, 2001