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SPIE Proceedings [SPIE International Conference on Solid State Crystals 2000 - Zakopane, Poland (Monday 9 October 2000)] International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology - Analysis of two-dimensional PITS spectra for characterization of defect centers in high-resistivity materials
Pawlowski, Michal, Rutkowski, Jaroslaw, Wenus, Jakub, Miczuga, M., Kaminski, Pawel, Kubiak, Leszek, Kozlowski, RomanVolume:
4413
Year:
2000
Language:
english
DOI:
10.1117/12.425431
File:
PDF, 1.02 MB
english, 2000