SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday 5 June 2000)] Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light - Spectroellipsometric investigation of GaSb surfaces after their chemical wet etching
Kudla, Andrzej, Papis-Polakowska, Ewa, Pluta, MaksymilianVolume:
4517
Year:
2001
Language:
english
DOI:
10.1117/12.435964
File:
PDF, 524 KB
english, 2001