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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering - Moire interferometry using stuck foil-embossed diffraction grating
Vaclavik, Jaroslav, Minster, Jiri, Houha, Roman, Hoefling, Roland, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4399
Year:
2001
Language:
english
DOI:
10.1117/12.445585
File:
PDF, 421 KB
english, 2001