SPIE Proceedings [SPIE International Symposium on Optical...

  • Main
  • SPIE Proceedings [SPIE International...

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 29 July 2001)] Surface Scattering and Diffraction for Advanced Metrology - Redistribution of modes in a surface disordered waveguide

Chaikina, Elena I., Gu, Zu-Han, Maradudin, Alexei A., Puente, N. Patricia, Leskova, Tamara A., Mendez, Eugenio R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4447
Year:
2001
Language:
english
DOI:
10.1117/12.446726
File:
PDF, 308 KB
english, 2001
Conversion to is in progress
Conversion to is failed