SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 29 July 2001)] Surface Scattering and Diffraction for Advanced Metrology - Redistribution of modes in a surface disordered waveguide
Chaikina, Elena I., Gu, Zu-Han, Maradudin, Alexei A., Puente, N. Patricia, Leskova, Tamara A., Mendez, Eugenio R.Volume:
4447
Year:
2001
Language:
english
DOI:
10.1117/12.446726
File:
PDF, 308 KB
english, 2001