SPIE Proceedings [SPIE Intelligent Systems and Advanced...

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SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Sensors and Controls for Intelligent Manufacturing II - Novel subpixel imaging system with linear CCD sensors

Wen, Desheng, Liu, XinPing, Qiao, Wei, Wang, Hu, Deng, Nianmao, Orban, Peter E.
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Volume:
4563
Year:
2001
Language:
english
DOI:
10.1117/12.452652
File:
PDF, 516 KB
english, 2001
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