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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - Micromechanical evaluation of bone microstructures under load
Mueller, Ralph, Bonse, Ulrich, Boesch, Tobias, Jarak, Drazen, Stauber, Martin, Nazarian, Ara, Tantillo, Michelle, Boyd, StevenVolume:
4503
Year:
2001
Language:
english
DOI:
10.1117/12.452845
File:
PDF, 435 KB
english, 2001