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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 29 July 2001)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VII, and Optical Data Storage - New photorefractive imaging x-ray sensor
Berben, Dirk, Yin, Shizhuo, Yu, Francis T. S., Andreas, Birk, Buse, Karsten, Coufal, Hans J.Volume:
4459
Year:
2001
Language:
english
DOI:
10.1117/12.454012
File:
PDF, 242 KB
english, 2001