SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Machine Vision Applications in Industrial Inspection X - Real-time aspects of SOM-based visual surface inspection

Niskanen, Matti, Kauppinen, Hannu, Silven, Olli, Hunt, Martin A.
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Volume:
4664
Year:
2002
Language:
english
DOI:
10.1117/12.460189
File:
PDF, 347 KB
english, 2002
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