SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Test and Measurement Applications of Optoelectronic Devices - Mapping of current and heat flows in IR light-emitting devices and lasers
Malyutenko, Volodymyr K., Chin, Aland K., Dutta, Niloy K., Herrick, Robert W., Linden, Kurt J., McGraw, Daniel J.Volume:
4648
Year:
2002
Language:
english
DOI:
10.1117/12.462658
File:
PDF, 294 KB
english, 2002