SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - Customized safety features by measuring of spectral characteristics of IR-sensitive taggants
Jasiorski, Marek, Podbielska, Halina, Strek, Wieslaw, Marciniak, Ireneusz, Stankiewicz, Marek, van Renesse, Rudolf L.Volume:
4677
Year:
2002
Language:
english
DOI:
10.1117/12.462706
File:
PDF, 120 KB
english, 2002