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SPIE Proceedings [SPIE High-Power Lasers and Applications - San Jose, California, United States (Sunday 20 January 2002)] Photon Processing in Microelectronics and Photonics - Laser-based sample preparation for electronic package failure analysis
Frazier, Brandon M., Sugioka, Koji, Gower, Malcolm C., Mathews, Scott A., Duignan, Michael T., Haglund, Jr., Richard F., Pique, Alberto, Skoglund, Lars D., Wang, Zhiyong, Traeger, Frank, Dubowski, JanVolume:
4637
Year:
2002
Language:
english
DOI:
10.1117/12.470645
File:
PDF, 456 KB
english, 2002