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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Materials and Devices for Sensing and Imaging - Measurement of 2-D micro-displacement and calibration of distorted image data via annular bar code ruler
Zhang, Xiao, Yao, Jianquan, Ishii, Yukihiro, Wang, Zhixing, Wang, Zhengdong, Li, XiangyenVolume:
4919
Year:
2002
Language:
english
DOI:
10.1117/12.471897
File:
PDF, 176 KB
english, 2002