SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Absolute 3D sensor with single fringe-pattern recording
Kasai, Yoichiro, Miyamoto, Yoko, Takeda, Mitsuo, Tanaka, Hideyuki, Gu, Ruowei, Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484554
File:
PDF, 627 KB
english, 2002