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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Statistical characterization of speckle noise in coherent imaging systems
Yaroslavsky, Leonid, Osten, Wolfgang, Kujawinska, Malgorzata, Shefler, A., Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.502054
File:
PDF, 298 KB
english, 2003