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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] X-Ray and Gamma-Ray Instrumentation for Astronomy XIII - High-sensitivity x-ray polarimetry with amorphous-silicon active-matrix pixel proportional counters
Black, J. K., Deines-Jones, Phil, Jahoda, Keith, Ready, Steve E., Street, Robert A.Volume:
5165
Year:
2003
Language:
english
DOI:
10.1117/12.504862
File:
PDF, 531 KB
english, 2003