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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors - Methods for measuring single attosecond x-ray pulses
Itatani, Jiro, Tatchyn, Roman O., Chang, Zenghu, Quere, Fabien, Yudin, Gennady L., Kieffer, Jean-Claude, Hastings, Jerome B., Corkum, Paul B.Volume:
5194
Year:
2003
Language:
english
DOI:
10.1117/12.512748
File:
PDF, 684 KB
english, 2003