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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Detectors and Associated Signal Processing - Analysis and potentialities of backside-illuminated thinned CMOS imagers
Marques Vatus, Cecilia, Chatard, Jean-Pierre, Dennis, Peter N. J., Magnan, PierreVolume:
5251
Year:
2003
Language:
english
DOI:
10.1117/12.513893
File:
PDF, 400 KB
english, 2003