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SPIE Proceedings [SPIE Speckle Metrology 2003 - Trondheim, Norway (Wednesday 18 June 2003)] Speckle Metrology 2003 - Tube junction study by electronic speckle pattern interferometry
Moreno Yeras, AlfredoVolume:
4933
Year:
2003
Language:
english
DOI:
10.1117/12.516664
File:
PDF, 202 KB
english, 2003