SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Machine Vision Applications in Industrial Inspection XII - A SOM-based system for web surface inspection
Iivarinen, Jukka, Price, Jeffery R., Meriaudeau, Fabrice, Pakkanen, Jussi, Rauhamaa, JuhaniVolume:
5303
Year:
2004
Language:
english
DOI:
10.1117/12.526617
File:
PDF, 835 KB
english, 2004