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SPIE Proceedings [SPIE Optical Data Storage 2003 - Vancouver, Canada (Sunday 11 May 2003)] Optical Data Storage 2003 - New test stand for dynamically testing coupon samples
Zhang, Yan, O'Neill, Michael, Miyagawa, Naoyasu, Milster, Thomas D., Butz, John, Bletscher, Warren L.Volume:
5069
Year:
2003
Language:
english
DOI:
10.1117/12.533129
File:
PDF, 253 KB
english, 2003