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SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - MOSFET noise modeling and parameter extraction
Danneville, Francois, Berroth, Manfred, Basaran, Umut, Bonani, Fabrizio, Deen, M. Jamal, Ma, Bo, Levinshtein, Michael E.Volume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.546997
File:
PDF, 426 KB
english, 2004