SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Complex Mediums V: Light and Complexity - Bias and temperature effect on the carrier transport parameters in impedance spectroscopy
Kwok, Harry L., McCall, Martin W., Dewar, GraemeVolume:
5508
Year:
2004
Language:
english
DOI:
10.1117/12.552726
File:
PDF, 53 KB
english, 2004