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SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - A framework for accurate and fast shape matching
Sidla, Oliver, Harding, Kevin G., Nauschnegg, BernhardVolume:
5606
Year:
2004
DOI:
10.1117/12.570142
File:
PDF, 208 KB
2004